The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 31, 2022

Filed:

Dec. 10, 2020
Applicant:

Mpi Corporation, Chu-Pei, TW;

Inventors:

Ping-Ying Wu, Chu-Pei, TW;

Chiu-Wang Chen, Chu-Pei, TW;

Yung-Chin Liu, Chu-Pei, TW;

Assignee:

MPI CORPORATION, Chu-Pei, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/88 (2006.01);
U.S. Cl.
CPC ...
G01N 21/8806 (2013.01); G01N 21/8851 (2013.01); G01N 2021/8887 (2013.01);
Abstract

An optical inspection system includes a brightness inspection module for inspecting the brightness of a light emitting element, an integrated inspection module for inspecting the near field optical characteristic and the beam quality factor of the light emitting element, and a far field inspection module for inspecting the far field optical characteristic of the light emitting element. As a result, the optical inspection system is space-saving and capable of reducing the distance and time of the movement of the device under test.


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