Chitomi Terayama

Title: Chitomi Terayama: Innovator in Integrated Circuit Testing

Introduction

Chitomi Terayama is a notable inventor based in Tokyo, Japan. He has made significant contributions to the field of integrated circuit testing, holding a total of 2 patents. His work focuses on enhancing the efficiency and accuracy of testing processes in electronic devices.

Latest Patents

Terayama's latest patents include an integrated circuit tester and a failure analysis device for IC testers and memory devices. The integrated circuit tester features timing axis signals that allow for testing without discrepancies. It utilizes an electro-optic probe positioned near contact points of the device under test, measuring skew at equal or pre-set distances. A phase detector identifies the phase of the timing axis signals, while a phase difference calculator determines the difference between the detected phase and a reference value. The phase controller then adjusts the timing axis signals to eliminate the phase difference. His second patent, the failure analysis device, simplifies and accelerates the failure analysis of memory devices. It analyzes failure data from a memory device, storing it in a memory unit and allowing for selective address output.

Career Highlights

Chitomi Terayama is currently employed at Ando Electric Company, where he continues to innovate in the field of electronic testing. His work has been instrumental in advancing the technology used in integrated circuits.

Collaborations

Some of his notable coworkers include Nobuaki Takeuchi and Yoshiki Yanagisawa, who contribute to the collaborative environment at Ando Electric Company.

Conclusion

Chitomi Terayama's contributions to integrated circuit testing through his innovative patents demonstrate his expertise and commitment to advancing technology in the electronics industry. His work continues to influence the field and improve testing methodologies.