Ando Electric Company

Chitomi Terayama

Nobuaki Takeuchi

Yoshiki Yanagisawa

Takayuki Sugizaki

Pins of an integrated circuit are provided with timing axis signals for testing in the time axis without discrepancies. An electro-optic probe in proximity to a plurality of contact points of a device under test uses positions of equal distance or a pre-set distance as skew measurement points, and detects timing axis signals on each microstrip line, A phase detector detects the phase of the timing axis signals that the electro-optic probe detects, and a phase difference calculator finds the phase difference between the phase detected by the phase detector and a reference value. Phase control of the timing axis signals is carried out by a phase controller so as to cancel the obtained phase difference.

Integrated circuit tester

A failure analysis device of the present invention performs a simple and quick failure analysis of a memory device. The failure analysis device for an IC tester analyzes failure data received from a memory device and comprises a memory and a selector. The memory stores the failure data. The selector optionally selects an address to which the failure data is written. The selectors connect the address with an address of the memory and output the failure data to the memory.

Growing community of inventors

Tokyo, Japan

Chitomi Terayama