The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 02, 1999
Filed:
Apr. 14, 1998
Applicant:
Inventor:
Chitomi Terayama, Tokyo, JP;
Assignee:
Ando Electric Co., Ltd., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R / ; G11C / ;
U.S. Cl.
CPC ...
714738 ; 365201 ;
Abstract
A failure analysis device of the present invention performs a simple and quick failure analysis of a memory device. The failure analysis device for an IC tester analyzes failure data received from a memory device and comprises a memory and a selector. The memory stores the failure data. The selector optionally selects an address to which the failure data is written. The selectors connect the address with an address of the memory and output the failure data to the memory.