The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 07, 2003

Filed:

Feb. 22, 2000
Applicant:
Inventors:

Nobuaki Takeuchi, Tokyo, JP;

Yoshiki Yanagisawa, Tokyo, JP;

Chitomi Terayama, Tokyo, JP;

Takayuki Sugizaki, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11B 2/020 ; G01R 3/1308 ;
U.S. Cl.
CPC ...
G11B 2/020 ; G01R 3/1308 ;
Abstract

Pins of an integrated circuit are provided with timing axis signals for testing in the time axis without discrepancies. An electro-optic probe in proximity to a plurality of contact points of a device under test uses positions of equal distance or a pre-set distance as skew measurement points, and detects timing axis signals on each microstrip line, A phase detector detects the phase of the timing axis signals that the electro-optic probe detects, and a phase difference calculator finds the phase difference between the phase detected by the phase detector and a reference value. Phase control of the timing axis signals is carried out by a phase controller so as to cancel the obtained phase difference.


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