Hsinchu, Taiwan

Ching Tsann Leu

This inventor holds 1 USPTO granted patent. Top assignee: Elite Semiconductor Memory Technology, Inc. Active years: 2011.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ching Tsann Leu. Retrieved from https://idiyas.com/inventor/ching-tsann-leu

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 5(Granted Patents)


Company Filing History:


Years Active: 2011

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1 patent (USPTO):Explore Patents

Title: Innovations by Ching Tsann Leu

Introduction

Ching Tsann Leu is a notable inventor based in Hsinchu County, Taiwan. He has made significant contributions to the field of semiconductor technology. His innovative approach has led to the development of a unique method for conducting over-erase correction.

Latest Patents

Ching Tsann Leu holds a patent for a "Method for conducting over-erase correction." This method outlines a series of steps that include conducting a first erase and verification operation. If bit line leakage is detected after this operation, an FN soft program is utilized to correct the over-erased cells. Following this, a second erase and verification operation is conducted. If bit line leakage is still found, a hot carrier HC soft program is employed to correct the over-erased cells.

Career Highlights

Ching Tsann Leu is currently associated with Elite Semiconductor Memory Technology, Inc. His work at this company has been instrumental in advancing memory technology. He has demonstrated a strong commitment to innovation and excellence in his field.

Collaborations

Ching Tsann Leu has collaborated with several talented individuals, including Chung Zen Chen and Chung Shan Kuo. These collaborations have fostered a creative environment that encourages the development of cutting-edge technologies.

Conclusion

Ching Tsann Leu's contributions to semiconductor technology, particularly through his patent for over-erase correction, highlight his innovative spirit and dedication to advancing the field. His work continues to influence the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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