The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 12, 2011

Filed:

Jan. 08, 2009
Applicants:

Chung Zen Chen, Hsinchu, TW;

Chung Shan Kuo, Taipei County, TW;

Tzeng Ju Hsue, Taoyuan County, TW;

Ching Tsann Leu, Hsinchu County, TW;

Inventors:

Chung Zen Chen, Hsinchu, TW;

Chung Shan Kuo, Taipei County, TW;

Tzeng Ju Hsue, Taoyuan County, TW;

Ching Tsann Leu, Hsinchu County, TW;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11C 11/34 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for conducting an over-erase correction describes the steps of: conducting a first erase and verification operation; using an FN soft program to correct over-erased cells if bit line leakage is found after the first erase and verification operation; conducting a second erase and verification operation; and using a hot carrier HC soft program to correct over-erased cells if bit line leakage is found after the second erase and verification operation.


Find Patent Forward Citations

Chen, Chung. (2011). Method for conducting over-erase correction (U.S. Patent No. 7924610). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7924610

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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