Chin-Ti Ko

Title: Innovations by Chin-Ti Ko in Semiconductor Fabrication

Introduction

Chin-Ti Ko is a notable inventor based in Zhudong, Taiwan. He has made significant contributions to the field of semiconductor fabrication, particularly in the detection of defects on wafers. His innovative approach has the potential to enhance the efficiency and accuracy of semiconductor manufacturing processes.

Latest Patents

Chin-Ti Ko holds 1 patent for his invention titled "Detection of defects on wafer during semiconductor fabrication." This patent introduces systems and techniques for detecting defects on a wafer by utilizing non-correctable error data obtained from a scan of the wafer. The process involves reconstructing the non-correctable error data to create a non-correctable error image map, which is then transformed to generate a projection. In certain embodiments, the image map is processed using feature extraction transforms, such as the Hough transform or Radon transform. The resulting projection is compared against a set of rules to identify signatures in the image map that indicate defects.

Career Highlights

Chin-Ti Ko is associated with Taiwan Semiconductor Manufacturing Company Limited, a leading player in the semiconductor industry. His work focuses on improving the reliability and quality of semiconductor products through innovative defect detection methods.

Collaborations

Chin-Ti Ko has collaborated with notable colleagues, including Chun-Hsien Lin and Liu Bo-Tsun. Their combined expertise contributes to advancements in semiconductor technology and defect detection methodologies.

Conclusion

Chin-Ti Ko's contributions to semiconductor fabrication through his innovative patent demonstrate his commitment to enhancing manufacturing processes. His work not only addresses current challenges in the industry but also paves the way for future advancements in semiconductor technology.