Taoyuan, Taiwan

Chin-Hsi Chang

This inventor holds 4 USPTO granted patents. Top assignee: Kinsus Interconnect Technology Corp.. Active years: 2019-2021.


% Patents Active = 75.0

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 4(Granted Patents)


Company Filing History:


Years Active: 2019-2021

Loading Chart...
4 patents (USPTO):Explore Patents

Title: Biography of Inventor Chin-Hsi Chang

Introduction: Chin-Hsi Chang is a prominent inventor based in Taoyuan, Taiwan. He has made significant contributions to the field of circuit board technology, holding a total of four patents. His innovative work focuses on enhancing the manufacturing processes of multi-layer circuit boards.

Latest Patents: One of his latest patents is a method for manufacturing a multi-layer circuit board capable of being applied with electrical testing. This invention involves a multi-layer circuit structure that is disposed on a delivery loading plate through a bottom-layer circuit structure. The delivery loading plate exposes a conductive corrosion-barrier layer, allowing the top-layer circuit of the multi-layer circuit structure to be electrically connected to the conductive corrosion-barrier layer through the bottom-layer circuit and an electrical connection layer. This design enables electrical testing to be applied to the multi-layer circuit board before it is delivered to assembly companies or packaged with chips.

Another notable patent is a multi-layer circuit board capable of being applied with electrical testing and the method for manufacturing the same. This invention includes a metallic delivery loading plate, a bottom-layer circuit structure, a conductive corrosion-barrier layer, and a multi-layer circuit structure. The bottom-layer circuit structure overlaps the delivery loading plate, while the conductive corrosion-barrier layer is disposed on the bottom dielectric layer. The multi-layer circuit structure overlaps the bottom-layer circuit structure, ensuring that the top-layer circuit is electrically connected to the conductive

Profile summary based on public USPTO records.
Please report any incorrect information to [email protected]
Loading…