Tainan, Taiwan

Chih Hsiang Chang

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: United Microelectronics Corp.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Chih Hsiang Chang. Retrieved from https://idiyas.com/inventor/chih-hsiang-chang-8ay2iohp

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Chih Hsiang Chang: Inventor in Semiconductor Protection Technology.

Introduction

Chih Hsiang Chang is an inventor associated with Tainan, Taiwan, and United Microelectronics Corporation. His patent work addresses electrostatic discharge protection, an important area of semiconductor device design.

Latest Patents

Chang is credited with 1 patent: “Electrostatic Discharge Protection Device and Method of Fabricating the Same.” The invention describes an electrostatic discharge protection device with a gate structure formed on a substrate. Its body part connects to multiple extension parts that extend in a different direction. First doped regions lie between the extension parts, while second doped regions are positioned on their outer sides. The two sets of doped regions have different conductivity types.

Career Highlights

Chang’s listed patent reflects work on semiconductor protection structures and their fabrication. The available information identifies him with United Microelectronics Corporation.

Collaborations

Chang’s named coworkers include Yin-Chia Tsai and Tien-Hao Tang.

Conclusion

Chih Hsiang Chang’s patent focuses on a structured approach to electrostatic discharge protection in semiconductor devices, contributing to the broader field of chip reliability.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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