Tainan, Taiwan

Chien-Wei Huang


Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2018-2020

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2 patents (USPTO):Explore Patents

Title: Chien-Wei Huang: Innovator in Semiconductor Technology

Introduction

Chien-Wei Huang is a prominent inventor based in Tainan, Taiwan. He has made significant contributions to the field of semiconductor technology, holding a total of 2 patents. His work focuses on innovative methods for monitoring critical dimensions in semiconductor manufacturing processes.

Latest Patents

Huang's latest patents include a semiconductor pattern for monitoring overlay and critical dimension at the post-etching stage. This invention features a first inverted-T shaped pattern with a base portion and a middle portion extending from the base portion. Additionally, it includes a second pattern that is adjacent and spaced apart from the base portion of the first inverted-T shaped pattern. Both patterns are composed of a plurality of spacer patterns that are spaced apart from each other, enhancing the precision of semiconductor manufacturing.

Career Highlights

Throughout his career, Chien-Wei Huang has worked with notable companies in the semiconductor industry. He has been associated with United Microelectronics Corporation and Fujian Jinhua Integrated Circuit Co., Ltd. His experience in these organizations has contributed to his expertise in semiconductor technologies.

Collaborations

Huang has collaborated with several professionals in his field, including Chien-Hao Chen and Chia-Hung Wang. These collaborations have further enriched his work and innovations in semiconductor technology.

Conclusion

Chien-Wei Huang is a key figure in the semiconductor industry, with a focus on innovative solutions for monitoring critical dimensions in manufacturing processes. His contributions continue to influence advancements in semiconductor technology.

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