This inventor holds 2 USPTO granted patents. Top assignee: Mpi Corporation. Active years: 2016-2017.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Location History:
- Chu-Pei, TW (2016)
- Hsinchu County, TW (2017)
Company Filing History:
Years Active: 2016-2017
Title: Innovations by Chien-Kuei Wang
Introduction
Chien-Kuei Wang is a notable inventor based in Hsinchu County, Taiwan. He has made significant contributions to the field of semiconductor testing, particularly through his innovative designs and methodologies. With a total of 2 patents, Wang continues to push the boundaries of technology in his industry.
Latest Patents
Wang's latest patents include a wafer testing probe card and a method of manufacturing a space transformer for a probe card. The wafer testing probe card features a printed circuit board, a flexible circuit board, an elastic piece, and a probe unit. This design allows for efficient testing of semiconductor wafers. The method of manufacturing a space transformer involves mounting and electrically connecting second substrates on a first substrate, forming an insulated layer with through holes, and creating electrically conductive blocks. This innovative approach ensures that any unexpected relative displacement during mounting does not affect the positions of the conductive blocks.
Career Highlights
Chien-Kuei Wang is currently employed at Mpi Corporation, where he applies his expertise in semiconductor technology. His work has been instrumental in advancing the efficiency and reliability of probe cards used in wafer testing.
Collaborations
Wang collaborates with talented individuals such as Ming-Chi Chen and Tien-Chia Li, who contribute to the innovative environment at Mpi Corporation.
Conclusion
Chien-Kuei Wang's contributions to the field of semiconductor testing through his patents and work at Mpi Corporation highlight his role as a key innovator in the industry. His inventions continue to influence the development of more efficient testing methods for semiconductor technology.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
