Company Filing History:
Years Active: 2015-2016
Title: Chien-Chang Lai: Innovator in Optical Inspection Technology
Introduction
Chien-Chang Lai is a notable inventor based in Chu-Pei, Taiwan. He has made significant contributions to the field of optical inspection technology, holding a total of 2 patents. His work focuses on enhancing the efficiency and accuracy of testing electric characteristics of chips.
Latest Patents
Lai's latest patents include a "Probe Holding Structure" and an "Optical Inspection Device Equipped with the Same." The probe holding structure features a substrate with an opening and grooves arranged around it. This design allows for multiple holding modules to connect with the grooves, each containing a fixing member and several probes. The combination of this structure with a lens adjusting mechanism forms an optical inspection device that effectively tests the electric characteristics of chips.
Another significant patent is the "High Frequency Probe Card." This invention consists of at least one substrate with openings, an interposing plate, and a circuit board. The design includes probe modules that pass through the substrate and are electrically connected to the circuit board. This innovative approach enhances the functionality of high-frequency signal probes, ensuring accurate measurements.
Career Highlights
Chien-Chang Lai is currently associated with Mpi Corporation, where he continues to develop cutting-edge technologies. His work has positioned him as a key player in the field of optical inspection and testing.
Collaborations
Lai collaborates with talented coworkers, including Chia-Tai Chang and Chin-Yi Tsai, contributing to a dynamic and innovative work environment.
Conclusion
Chien-Chang Lai's contributions to optical inspection technology through his patents demonstrate his commitment to innovation and excellence in the field. His work continues to influence the industry and improve testing methodologies.