This inventor holds 1 USPTO granted patent. Top assignee: United Microelectronics Corp.. Active years: 2013.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2013
Title: Innovator Spotlight: Chia-Jen Wang and His Contribution to Defect Inspection Technology
Introduction: Chia-Jen Wang is an influential inventor based in Pingtung County, Taiwan. With a focus on optimizing defect inspection processes, Wang has made noteworthy advancements in the field of semiconductor manufacturing. His innovative approach promises to improve the efficiency and accuracy of defect detection in various applications.
Latest Patents: Wang holds a patent for a method and pattern carrier designed to optimize the inspection recipe of defect inspection tools. This patent describes a technique that involves providing a substrate with intentional defects alongside locating patterns. The defect inspection tool utilizes this inspection recipe to identify intentional defects and assess the distribution of those that remain undetected or have only been partially detected. By modifying the inspection recipe based on the types of defects identified, Wang's method minimizes the number of undetected or partially detected intentional defects, enhancing overall inspection effectiveness.
Career Highlights: Chia-Jen Wang is employed at United Microelectronics Corporation, where he applies his expertise in semiconductor technology. His work has been instrumental in developing cutting-edge inspection methodologies that support the company's commitment to high-quality semiconductor fabrication.
Collaborations: Throughout his career, Wang has collaborated with esteemed colleagues, including Pong-Wey Huang and Hsi-Hua Liu. Their combined efforts in the field of defect inspection technologies demonstrate the value of teamwork in driving innovation and addressing complex challenges in semiconductor manufacturing.
Conclusion: As an inventor, Chia-Jen Wang exemplifies the spirit of innovation within the semiconductor industry. His patented method for optimizing defect inspection tools not only addresses current challenges but also sets the stage for future advancements in technology. Wang's contributions continue to play a crucial role in ensuring higher standards of quality and efficiency in manufacturing processes.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
