Taichung, Taiwan

Chi-Hsin Chan

This inventor holds 1 USPTO granted patent. Top assignee: Taiwan Semiconductor Manufacturing Comp. Ltd.. Active years: 2017.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Chi-Hsin Chan. Retrieved from https://idiyas.com/inventor/chi-hsin-chan

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2017

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1 patent (USPTO):Explore Patents

Title: Chi-Hsin Chan: Semiconductor Wafer-Positioning Inventor

Introduction

Chi-Hsin Chan is an inventor based in Taichung, Taiwan. His work includes an invention for positioning wafers during semiconductor manufacturing. He is associated with Taiwan Semiconductor Manufacturing Company Limited and has 1 patent listed in the provided information.

Latest Patents

Chan’s listed patent, “Method and System for Positioning Wafer in Semiconductor Manufacturing Fabrication,” describes a method for checking and correcting a wafer’s position inside a processing chamber. A transferring module sends the wafer into the chamber, while a monitoring module captures a video image of its edge. Image analysis determines whether the edge is correctly positioned. If it is not, the system calculates a shifting value and moves the wafer accordingly.

Career Highlights

The patent addresses wafer alignment in semiconductor fabrication by combining video monitoring, image analysis, and automated positioning. This approach is intended to identify and correct placement errors during processing.

Collaborations

The provided information names Chune-Te Yang and Chung-Jhieh Chen as Chan’s coworkers. It does not specify their roles in the patent or describe particular collaborative contributions.

Conclusion

Chi-Hsin Chan’s listed patent focuses on using image-based monitoring and corrective movement to position wafers in semiconductor manufacturing.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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