Chi-Chan Hsu

**Title: Chi-Chan Hsu: Innovator in Integrated Circuit Testing**

Introduction

Chi-Chan Hsu is a prominent inventor based in Hsinchu, Taiwan, known for his contributions to the field of integrated circuits. With a total of four patents to his name, Hsu has made significant strides in the development of methods and apparatus for enhancing test processes in scan-based integrated circuits.

Latest Patents

Hsu's latest inventions include a **Multiple-capture DFT system for scan-based integrated circuits**. This innovative method and apparatus provide ordered capture clocks to detect or localize faults within multiple clock domains in scan-based integrated circuit assemblies. The system allows for effective testing in self-test or scan-test modes, permitting the application of an ordered sequence of capture clocks across various scan cells. Notably, it employs a computer-aided design (CAD) methodology to synthesize the apparatus, all while improving fault coverage and minimizing memory usage.

Another of his key patents is the **Method and apparatus for unifying self-test with scan-test during prototype debug and production test**. This invention introduces a unified testing approach that utilizes a test controller, improving the diagnostic processes for faults within integrated circuits. The capture clock generator embedded in each clock domain facilitates efficient testing at varying speeds, thus allowing designers to effectively address both stuck-type and non-stuck-type faults. This methodology further integrates CAD techniques, enhancing the overall functionality and reliability of testing mechanisms.

Career Highlights

Currently, Chi-Chan Hsu is employed at Syntest Technologies, Inc., where he continues to innovate within the realm of circuit testing and diagnosis. His work is characterized by a commitment to improving testing efficiency, which is crucial in today’s fast-paced electronic environment.

Collaborations

Hsu's innovative endeavors are often carried out in collaboration with notable colleagues, including Meng-Chyi Lin and Xiaoqing Wen. Their combined expertise and collaborative efforts have greatly contributed to the successful development of Hsu's patents, pushing the boundaries of what is possible in integrated circuit testing.

Conclusion

With his substantial contributions to the field of integrated circuits, Chi-Chan Hsu stands out as a significant inventor and leader at the forefront of technological advancement. His innovative patents not only enhance testing methodologies but also set new standards in the industry, ensuring higher reliability and efficiency for integrated circuit applications.