Company Filing History:
Years Active: 2016-2018
Title: Cheng Yen-Wei: Innovator in Semiconductor Fabrication Technologies
Introduction
Cheng Yen-Wei is a prominent inventor based in Hsinchu, Taiwan. He has made significant contributions to the field of semiconductor fabrication, holding a total of 2 patents. His work focuses on enhancing the precision and efficiency of semiconductor manufacturing processes.
Latest Patents
Cheng's latest patents include a method and system for chemical mechanical planarization (CMP). This innovative system comprises various components such as an emitter, a detector, and a CMP device. It generates a spectroscopic signal to determine the thickness of materials on a wafer, allowing for precise adjustments to achieve desired thickness levels. This advancement increases the sensitivity of CMP, ensuring greater accuracy in material reduction.
Another notable patent involves semiconductor fabrication component retuning. This invention provides systems and techniques for evaluating and adjusting parameters associated with semiconductor fabrication processing. By formulating performance indices and conducting fabrication process change simulations, the system identifies optimal tuning values for improved performance of semiconductor fabrication components.
Career Highlights
Cheng Yen-Wei is currently employed at Taiwan Semiconductor Manufacturing Company Ltd., a leading entity in the semiconductor industry. His work at this prestigious company has allowed him to contribute to cutting-edge technologies that drive advancements in semiconductor manufacturing.
Collaborations
Cheng has collaborated with esteemed colleagues such as Jong-I Mou and Keung Hui. These partnerships have fostered innovation and have been instrumental in the development of his patented technologies.
Conclusion
Cheng Yen-Wei's contributions to semiconductor fabrication through his innovative patents demonstrate his commitment to advancing technology in this critical field. His work continues to influence the efficiency and precision of semiconductor manufacturing processes.