Cheng-An J Lin

Title: Cheng-An J Lin: Innovator in Optical Measurement and Nanotechnology

Introduction

Cheng-An J Lin is a prominent inventor based in Taoyuan County, Taiwan. He has made significant contributions to the fields of optical measurement and nanotechnology, holding a total of 7 patents. His innovative work has paved the way for advancements in measurement techniques and materials science.

Latest Patents

One of his latest patents is a device and method for performing total internal reflection scattering measurement. This invention includes a device that comprises a first reflective plate with a first opening and a second reflective plate with second and third openings. The design allows for a sample slide to be accommodated in a slot between the plates, where a white light source illuminates the sample for TIRS measurement. Another notable patent involves composite fluorescent gold nanoclusters with high quantum yield, which includes a gold nanocluster encapsulated by a capping layer made of a benzene-based compound and phosphine-based compounds.

Career Highlights

Cheng-An J Lin has worked at notable institutions such as Chung Yuan Christian University and Mackay Memorial Hospital. His experience in these organizations has contributed to his expertise in research and development in his fields of interest.

Collaborations

He has collaborated with esteemed colleagues, including Walter H Chang and Chih-Hsien Lee, further enhancing the impact of his work through teamwork and shared knowledge.

Conclusion

Cheng-An J Lin's contributions to optical measurement and nanotechnology demonstrate his innovative spirit and dedication to advancing scientific knowledge. His patents reflect a commitment to developing practical solutions that can benefit various industries.