This inventor holds 3 USPTO granted patents and 2 published patent applications. Top assignee: Applied Materials, Inc.. Active years: 2025-2026.
Company Filing History:
Years Active: 2025-2026
Title: Innovations of Chenfei Hu in Optical Process Sensing
Introduction
Chenfei Hu is an accomplished inventor based in Cupertino, CA, known for his significant contributions to the field of optical process sensing. With a focus on enhancing the performance of processing chambers, Hu has developed innovative methods that improve the efficiency and accuracy of manufacturing processes.
Latest Patents
One of Hu's notable patents is titled "Process characterization and correction using optical wall process sensor (OWPS)." This patent describes a method that involves receiving first data from an optical sensor within a processing chamber. The method processes this data to obtain second data, which indicates the condition of a coating on the chamber's interior surface. Furthermore, it generates an indication of the performance of the processing operation based on the second data and facilitates corrective actions to optimize the chamber's performance. Hu holds 1 patent in this area.
Career Highlights
Chenfei Hu is currently employed at Applied Materials, Inc., a leading company in the semiconductor and display manufacturing industry. His work focuses on developing advanced technologies that enhance manufacturing processes and improve product quality. Hu's expertise in optical sensing has positioned him as a valuable asset in the field.
Collaborations
Throughout his career, Hu has collaborated with talented professionals, including Zhaozhao Zhu and Nicholas Ryan Pica. These collaborations have contributed to the advancement of innovative solutions in the industry.
Conclusion
Chenfei Hu's contributions to optical process sensing exemplify the impact of innovation in manufacturing technology. His work continues to influence the efficiency and effectiveness of processing operations, showcasing the importance of advancements in this field.
