Taipei, Taiwan

Chen-Ning Fuh


Average Co-Inventor Count = 6.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2005

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1 patent (USPTO):Explore Patents

Title: Inventor Chen-Ning Fuh: Innovating Linewidth Measurement Calibration

Introduction

Chen-Ning Fuh, an accomplished inventor based in Taipei, Taiwan, has made significant contributions to the field of microelectronics through his innovative work on calibration methods for linewidth measurement tools. His invention stands out in the industry and enhances the accuracy of measurements essential for producing high-quality microelectronic products.

Latest Patents

Chen-Ning Fuh holds a notable patent titled *Linewidth Measurement Tool Calibration Method Employing Linewidth Standard*. This patent details a methodology for calibrating linewidth measurement tools, specifically focusing on utilizing a series of periodic actual measurements and applying an exponentially weighted moving average to correct these measurements. This innovative approach leads to more precise calibrations and improves the accuracy of linewidth measurements in microelectronics manufacturing.

Career Highlights

Currently, Chen-Ning is affiliated with Taiwan Semiconductor Manufacturing Company Ltd., a leader in the semiconductor industry. His expertise in measurement tools and calibration methods showcases his commitment to advancing technology within the area of microelectronics. Throughout his career, he has focused on developing solutions that meet the industry’s ever-increasing demand for precision and reliability.

Collaborations

Chen-Ning has collaborated with notable colleagues, including Pey-Yuan Lee and Hong-Ji Yang, who contribute to the innovation culture within their team. Together, they work on various projects that aim to enhance manufacturing processes and improve product quality in the semiconductor sector.

Conclusion

In conclusion, Chen-Ning Fuh represents the spirit of innovation in microelectronics, with his patented techniques improving calibration methods in linewidth measurement tools. His work not only demonstrates his inventive capabilities but also emphasizes the importance of precision in the technology that underpins our digital world.

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