Chen-Hung Tien

Title: Innovations of Chen-Hung Tien

Introduction

Chen-Hung Tien is a notable inventor based in Hsinchu, Taiwan. He has made significant contributions to the field of semiconductor technology. His work primarily focuses on improving methods for probe testing dies, which is crucial for the manufacturing process in the semiconductor industry.

Latest Patents

Chen-Hung Tien holds a patent for an "Integrated fan-out pillar probe system." This innovative method involves loading a wafer containing multiple dies into a prober. The process includes bringing probes into contact with the first contact pads of the first die according to specific probe parameters. A first probe contact test is conducted to evaluate the contact between the probes and the pads. Following this, a die test is performed on the first die. The results from both tests are saved, and second probe parameters are automatically generated based on the initial test results. This patent highlights Tien's commitment to enhancing the efficiency and accuracy of semiconductor testing.

Career Highlights

Chen-Hung Tien is currently employed at Taiwan Semiconductor Manufacturing Company Limited, a leading firm in the semiconductor industry. His role involves developing advanced testing methods that contribute to the overall quality and reliability of semiconductor products. Tien's expertise in this area has positioned him as a valuable asset to his team and the company.

Collaborations

Some of Chen-Hung Tien's coworkers include Mill-Jer Wang and Mincent Lee. Their collaborative efforts in the field of semiconductor technology have led to advancements that benefit the industry as a whole.

Conclusion

In summary, Chen-Hung Tien is an influential inventor whose work in probe testing methods has made a significant impact on the semiconductor industry. His patent for the integrated fan-out pillar probe system exemplifies his innovative approach to solving complex challenges in semiconductor manufacturing.