Chen-Hsuan Hung

Title: Innovations of Chen-Hsuan Hung in Wafer Defect Detection

Introduction

Chen-Hsuan Hung is an accomplished inventor based in Tainan, Taiwan. He has made significant contributions to the field of semiconductor technology, particularly in the area of wafer defect detection. His innovative methods and apparatus have the potential to enhance the quality control processes in semiconductor manufacturing.

Latest Patents

Chen-Hsuan Hung holds a patent for a "Wafer backside defect detection method and wafer backside defect detection apparatus." This patent outlines a method that includes several steps to identify defects on the backside of wafers. The process involves cropping off a peripheral edge area of a wafer backside image where at least one notch is located. It connects adjacent white pixels to obtain multiple abnormal regions. If the total area of the top N abnormal regions exceeds 10% of the wafer's area, it indicates a roughness defect. Conversely, if this area is less than 1% and the largest abnormal region exceeds a predetermined length, it signifies a scratch defect. This innovative approach is crucial for maintaining the integrity of semiconductor wafers.

Career Highlights

Chen-Hsuan Hung is currently employed at United Microelectronics Corporation, a leading company in the semiconductor industry. His work focuses on developing advanced detection methods that improve the reliability of semiconductor products. His expertise in this field has positioned him as a valuable asset to his team and the company.

Collaborations

Chen-Hsuan collaborates with talented colleagues, including Cheng-Hsien Chen and Chia-Feng Hsiao. Their combined efforts contribute to the advancement of technologies in wafer defect detection and semiconductor manufacturing.

Conclusion

Chen-Hsuan Hung's innovative contributions to wafer defect detection exemplify the importance of advancements in semiconductor technology. His patent and ongoing work at United Microelectronics Corporation highlight his commitment to improving quality control in the industry.