Company Filing History:
Years Active: 2000
Title: Charles Schraver: Innovator in Semiconductor Technology
Introduction
Charles Schraver is a notable inventor based in Palm Harbor, FL (US). He has made significant contributions to the field of semiconductor technology, particularly through his innovative patent that enhances the accuracy of electrical measurements on semiconductor substrates.
Latest Patents
Schraver holds a patent for a "Device for electrically contacting a floating semiconductor wafer." This invention relates to a device designed for contacting and electrically grounding a semiconductor substrate that is coated with an insulating film. The device features a chuck with a wafer support surface that securely holds the wafer, along with a scriber that is movably attached to the chuck. The scriber is specifically configured to contact the wafer through an opening in the chuck, allowing it to produce a perforation through the insulating film. Additionally, the device includes an electrically conductive probe that can be moved into an access opening in the chuck to contact the semiconductor substrate through the perforation. This innovation significantly increases the accuracy of open circuit type measurements of the wafer surface potential, particularly for Kelvin and Monroe electrode measurements of the electrical properties of insulating films on semiconductor substrates.
Career Highlights
Charles Schraver is associated with Semiconductor Diagnostics, Inc., where he applies his expertise in semiconductor technology. His work has been instrumental in advancing the methods used for measuring electrical properties in semiconductor devices.
Collaborations
Schraver has collaborated with notable professionals in his field, including Jacek J Lagowski and Alexander Savtchouk. These collaborations have contributed to the development and refinement of his innovative technologies.
Conclusion
Charles Schraver's contributions to semiconductor technology through his patent demonstrate his commitment to innovation and precision in electrical measurements. His work continues to influence the field and enhance the capabilities of semiconductor diagnostics.