Albuquerque, NM, United States of America

Charles F Hawkins


Average Co-Inventor Count = 2.8

ph-index = 4

Forward Citations = 157(Granted Patents)


Location History:

  • Green Cove Springs, FL (US) (1997)
  • Bernalillo, NM (US) (2003)
  • Albuquerque, NM (US) (2003 - 2006)

Company Filing History:


Years Active: 1997-2006

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4 patents (USPTO):Explore Patents

Title: Innovations of Charles F Hawkins

Introduction

Charles F Hawkins is a notable inventor based in Albuquerque, NM (US), recognized for his contributions to semiconductor technology. He holds a total of four patents, showcasing his expertise in analyzing and improving integrated circuits.

Latest Patents

Hawkins' latest patents include a method for resistivity analysis of semiconductor dies. This invention enhances the detection and localization of defects within a semiconductor die by analyzing resistive electrical connections during state-changing operations. Another significant patent is an apparatus and method for analyzing functional failures in integrated circuits. This invention identifies and maps functional failures due to timing errors by utilizing input test vectors and adjusting various parameters such as voltage, temperature, and clock frequency. These innovations have applications in optimizing IC design, failure analysis, and validation testing.

Career Highlights

Throughout his career, Hawkins has worked with Advanced Micro Devices Corporation, where he contributed to advancements in semiconductor technology. His work has significantly impacted the field, particularly in the areas of failure analysis and circuit optimization.

Collaborations

Hawkins has collaborated with notable individuals such as Michael R Bruce and Victoria Jean Bruce, further enhancing his contributions to the field of semiconductor technology.

Conclusion

Charles F Hawkins is a distinguished inventor whose work in semiconductor technology has led to significant advancements in the analysis and optimization of integrated circuits. His innovative patents reflect his commitment to improving the functionality and reliability of electronic devices.

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