The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 13, 2006
Filed:
Jun. 02, 2000
Michael R. Bruce, Austin, TX (US);
Victoria J. Bruce, Austin, TX (US);
Rosalinda M. Ring, Austin, TX (US);
Edward Jr. I. Cole, Albuquerque, NM (US);
Charles F. Hawkins, Albuquerque, NM (US);
Paiboon Tangyungong, Albuquerque, NM (US);
Michael R. Bruce, Austin, TX (US);
Victoria J. Bruce, Austin, TX (US);
Rosalinda M. Ring, Austin, TX (US);
Edward Jr. I. Cole, Albuquerque, NM (US);
Charles F. Hawkins, Albuquerque, NM (US);
Paiboon Tangyungong, Albuquerque, NM (US);
Advance Micro Devices, Inc., Sunnyvale, CA (US);
Abstract
According to an example embodiment of the present invention a semiconductor die having a resistive electrical connection is analyzed. Heat is directed to the die as the die is undergoing a state-changing operation to cause a failure due to suspect circuitry. The die is monitored, and a circuit path that electrically changes in response to the heat is detected and used to detect that a particular portion therein of the circuit is resistive. In this manner, the detection and localization of a semiconductor die defect that includes a resistive portion of a circuit path is enhanced.