Other

Advanced Micro Devices Corporation

Advance Micro Devices, Inc.

Charles F Hawkins

Michael R Bruce

Rosalinda M Ring

Victoria Jean Bruce

Paiboon Tangyunyong

David Harry Eppes

Edward I Cole

Arnold Y Louie

Richard Jacob Wilcox

Jason Mulig

Paiboon Tangyungong

Edward I Cole, Jr

Edward Jr I Cole

According to an example embodiment of the present invention a semiconductor die having a resistive electrical connection is analyzed. Heat is directed to the die as the die is undergoing a state-changing operation to cause a failure due to suspect circuitry. The die is monitored, and a circuit path that electrically changes in response to the heat is detected and used to detect that a particular portion therein of the circuit is resistive. In this manner, the detection and localization of a semiconductor die defect that includes a resistive portion of a circuit path is enhanced.

Resistivity analysis

An apparatus and method are presented for identifying and mapping functional failures in an integrated circuit (IC) due to timing errors therein based on the generation of functional failures in the IC. This is done by providing a set of input test vectors to the IC and adjusting one or more: of the IC voltage, temperature or clock frequency; the rate at which the test vectors are provided to the IC; or the power level of a focused laser beam used to probe the IC and produce localized heating which changes the incidence of the functional failures in the IC which can be sensed for locating the IC circuit elements responsible for the functional failures. The present invention has applications for optimizing the design and fabrication of ICs, for failure analysis, and for qualification or validation testing of ICs.

Apparatus and method for analyzing functional failures in integrated circuits

A method and apparatus mechanism for testing data processing devices are implemented. The test mechanism isolates critical paths by correlating a scanning microscope image with a selected speed path failure. A trigger signal having a preselected value is generated at the start of each pattern vector. The sweep of the scanning microscope is controlled by a computer, which also receives and processes the image signals returned from the microscope. The value of the trigger signal is correlated with a set of pattern lines being driven on the DUT. The trigger is either asserted or negated depending the detection of a pattern line failure and the particular line that failed. In response to the detection of the particular speed path failure being characterized, and the trigger signal, the control computer overlays a mask on the image of the device under test (DUT). The overlaid image provides a visual correlation of the failure with the structural elements of the DUT at the level of resolution of the microscope itself.

Data processing device test apparatus and method therefor

A filter locking/support system for releasably urging and maintaining a plurality of separate depending filter elements in a dust collector into and in sealing engagement with the partition between the 'dirty' and 'clean' sections of said dust collector, said system being preferably made up of: a plurality of parallel pairs of elongated linear filter trays adapted to support cylindrical filters by the mounting plate thereof; which trays are slidably mounted upon a plurality of sloping brackets (or ramps) attached below the partition between the 'clean' and 'dirty' section of the dust collector such that movement of said trays in a first direction slides said trays up said ramps so as to bring the filter mounting plates resting thereon into sealing engagement with the partition and movement in the opposite direction slides said trays down said ramps so that the filters depending therefrom are no longer in sealing engagement with said partition; an automatic biasing means being provided to urge said trays in the first direction; and an operator engageable release being provided to counteract/disengage automatic biasing when desired.

Filter locking/support system for dust collectors

Growing community of inventors

Albuquerque, NM, United States of America

Charles F Hawkins