Tainan, Taiwan

Chao Nan Chen

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: United Microelectronics Corp.. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Chao Nan Chen. Retrieved from https://idiyas.com/inventor/chao-nan-chen-xocpkxaw

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 6.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Chao Nan Chen: Innovator in Semiconductor Technology

Introduction

Chao Nan Chen is a notable inventor based in Tainan, Taiwan. He has made significant contributions to the field of semiconductor technology, particularly through his innovative patent.

Latest Patents

Chao Nan Chen holds a patent for a semiconductor structure and its manufacturing method. This patent outlines a process that includes forming a gate structure on a substrate, performing a tilt implanting process to create a doped region, and subsequently forming recesses to accommodate a semiconductor layer. His work is crucial in advancing semiconductor manufacturing techniques.

Career Highlights

Chao Nan Chen is associated with United Microelectronics Corporation, where he applies his expertise in semiconductor technology. His career reflects a commitment to innovation and excellence in the field.

Collaborations

Chao Nan Chen has collaborated with notable colleagues, including Kuang-Hsiu Chen and Wei-Chung Sun. These collaborations have likely contributed to the advancement of their collective work in semiconductor technology.

Conclusion

Chao Nan Chen's contributions to semiconductor technology through his patent and work at United Microelectronics Corporation highlight his role as an influential inventor in the industry. His innovative methods continue to shape the future of semiconductor manufacturing.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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