Chang-Qing Mu

Title: Chang-Qing Mu: Innovator in DIMM Testing Technologies

Introduction

Chang-Qing Mu is a notable inventor based in Shanghai, China. He has made significant contributions to the field of testing technologies, particularly in the development of DIMM slot test systems. With a total of 2 patents, his work has advanced the efficiency and accuracy of electronic testing processes.

Latest Patents

Chang-Qing Mu's latest patents include a DIMM slot test system without series connection of the test board through JTAG. This innovative system allows a DIMM connector interface of a test board to be inserted into a DIMM slot of a circuit board under test. The CPU generates test data or a test signal based on a test signal with JTAG signal format. The CPU transmits test data to a specified CPLD chip through differential pins or IO pins, which records the received data as a test result. Additionally, the CPU tests power pins or ground pins, reading and recording their values as part of the test results.

Another significant patent is the method and device for generating boundary-scan interconnection lines. This method establishes a boundary scan test model based on boundary scan components and intermediate components on at least one test card and a unit under test (UUT) board. The boundary scan nets are constructed, and the paths are generated, ensuring high accuracy and coverage in path search operations.

Career Highlights

Throughout his career, Chang-Qing Mu has worked with prominent companies such as Inventec Corporation and Inventec (Pudong) Technology Corporation. His experience in these organizations has contributed to his expertise in electronic testing technologies.

Collaborations

Chang-Qing Mu has collaborated with notable coworkers, including Yuan Sang and Xue-Shan Han. Their combined efforts have furthered advancements in the field of testing technologies.

Conclusion

Chang-Qing Mu's innovative contributions to DIMM testing technologies and his collaborations with industry professionals highlight his significant role in advancing electronic testing methods. His patents reflect a commitment to improving the accuracy and efficiency of testing processes in the electronics industry.