Inventec Corp.

Inventec (pudong) Technology Corporation

Chang-Qing Mu

Yuan Sang

Xue-Shan Han

A DIMM slot test system without series connection of test board through JTAG and a method thereof are disclosed. A DIMM connector interface of a test board is inserted to a DIMM slot of a circuit board under test, a CPU generates test data or a test signal based on a test signal with JTAG signal format, the CPU transmits test data to a specified CPLD chip through differential pins or IO pins, the specified CPLD chip records the received data as a test result; the CPU transmits the generated test signal to the specified CPLD chip, which then tests power pins or ground pins, reads and records values of the power pins or the ground pins as the test result; the CPU generates and transmits a test result read signal to the specified CPLD chip through the control pins, obtains the test result through data transmission pins.

DIMM slot test system without series connection of test board through JTAG and method thereof

A method and a device for generating boundary-scan interconnection lines are disclosed. In the method, the boundary scan test model is established according to boundary scan components and intermediate components on least one test card and a unit under test (UUT) board, and connection relationships therebetween; the boundary scan nets of the boundary scan test model are constructed; the boundary scan paths of each boundary scan net are generated, and a path establishment condition of each boundary scan path is obtained; and the boundary scan paths are filtered and integrated, and the filtered and integrated boundary scan paths are divided according to the path establishment conditions of filtered and integrated boundary scan paths, into subtests which each has at least one boundary-scan interconnection line. As a result, the accuracy and high coverage of a path search operation can be guaranteed.

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Shanghai, China

Chang-Qing Mu