Hwaseong, South Korea

Chang-Ho Han

This inventor holds 3 USPTO granted patents. Top assignee: Samsung Electronics Co., Ltd.. Active years: 2017.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Chang-Ho Han. Retrieved from https://idiyas.com/inventor/chang-ho-han

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 66.7

Average Co-Inventor Count = 3.1

ph-index = 1

Forward Citations = 5(Granted Patents)


Company Filing History:


Years Active: 2017

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3 patents (USPTO):Explore Patents

Title: Chang-Ho Han’s Semiconductor and Circuit Simulation Patents.

Introduction

Chang-Ho Han is an inventor associated with Hwaseong, South Korea, and Samsung Electronics Co., Ltd. His patent work includes methods for analyzing electric-circuit yield and improving semiconductor fabrication processes. The supplied information lists 3 patents.

Latest Patents

One of Han’s latest patents, “Monte Carlo Simulation for Analyzing Yield of an Electric Circuit,” describes a simulation system and method for evaluating circuit yield. When an input’s nominal-point function value meets a specified condition, the system runs a corresponding simulation. For a different nominal-point value, the method sets a boundary for the input distribution, generates samples within that boundary, and uses machine learning to identify a worst-case point. It then repeats the process while shifting the distribution boundary until it reaches a minimum critical value.

Another patent, “Method and Apparatus for Fabricating Semiconductor Device,” concerns overlay measurement and wafer alignment. The method uses measurements from a first wafer lot to generate a regression equation, then applies a coefficient from that equation to align a wafer from a second lot. After measuring the second lot’s overlay, the method corrects the equation by adjusting coefficients in both its initial and residual components.

Career Highlights

Han’s listed work addresses two important technical challenges: estimating electric-circuit yield through simulation and refining overlay control during semiconductor fabrication. Both inventions describe data-driven processes intended to support analysis and manufacturing accuracy.

Collaborations

Han is associated with Samsung Electronics Co., Ltd. The supplied information also names Han-Hum Park and Jin-Young Lee as coworkers.

Conclusion

Chang-Ho Han’s listed patents reflect work in circuit-yield simulation and semiconductor manufacturing, connecting computational analysis with practical fabrication methods.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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