Chandrasekhar Roy

Title: Innovations by Inventor Chandrasekhar Roy

Introduction

Chandrasekhar Roy is a notable inventor based in Bengaluru, India. He has made significant contributions to the field of image analytics, particularly in substrate processing systems. With a total of 2 patents, his work focuses on enhancing the efficiency and reliability of manufacturing processes.

Latest Patents

One of his latest patents is titled "Edge defect detection via image analytics." This method involves identifying an image of an edge of a susceptor pocket formed by a susceptor in a substrate processing system. The process predicts whether the property values of the edge meet specific threshold values. If the values meet the criteria, a corrective action is initiated to improve the performance of the susceptor.

Another significant patent is "Clog detection via image analytics." This method identifies an image of a substrate processing equipment part that contains multiple holes. It determines the neighboring angular distance and area of each hole. The processing device identifies a subset of holes that are partially clogged, allowing for timely corrective actions to be performed.

Career Highlights

Chandrasekhar Roy is currently employed at Applied Materials, Inc., where he applies his expertise in image analytics to develop innovative solutions. His work has contributed to advancements in substrate processing technology, making manufacturing processes more efficient.

Collaborations

Chandrasekhar has collaborated with notable coworkers, including Sidda Reddy Kurakula and Boon Sen Chan. These collaborations have fostered a creative environment that encourages innovation and problem-solving.

Conclusion

Chandrasekhar Roy's contributions to image analytics and substrate processing systems highlight his role as a significant inventor in the field. His patents demonstrate a commitment to improving manufacturing processes through innovative solutions.