This inventor holds 2 USPTO granted patents. Top assignees: Instituto Nacional De Metrologia Qualidade E Technologia-Immetro, Instituto Nacional De Metrologia Qualidade E Tecnologia—inmetro, Universidade Federal De Menas Gerais-Ufmg. Active years: 2019-2020.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Location History:
- Belo Horizonte, BR (2019)
- Rio de Janeiro, BR (2020)
Company Filing History:
1 out of 1 
1 out of 1 
1 out of 1 
Years Active: 2019-2020
Title: Carlos Alberto Achete: Innovator in Scanning Probe Microscopy
Introduction
Carlos Alberto Achete is a notable inventor based in Rio de Janeiro, Brazil. He has made significant contributions to the field of microscopy through his innovative patents. With a total of two patents to his name, Achete has focused on developing advanced metallic devices for various microscopy applications.
Latest Patents
Achete's latest patents include a "Metallic device for scanning probe microscopy and method for manufacturing same." This invention describes a device designed for use in scanning probe microscopy, featuring a single body with two parts. The second part has a submicrometric point that defines a nanoscale apex. Additionally, the patent outlines a method for manufacturing a high optical efficiency probe for scanning probe microscopy. Another significant patent is the "Metallic device for scanning near-field optical microscopy and spectroscopy and method for manufacturing same." This invention relates to a metallic device that comprises a single body with longitudinal prolongation and a nanometric apex. It is designed to serve as a probe of high optical efficiency, enabling the analysis of nanometric structures with high resolution and reproducibility.
Career Highlights
Throughout his career, Achete has worked with esteemed institutions such as the Federal University of Minas Gerais (Universidade Federal De Minas Gerais - UFMG) and the National Institute of Metrology, Quality and Technology (Instituto Nacional De Metrologia Qualidade E Tecnologia - Inmetro). His work in these organizations has allowed him to further his research and development in the field of microscopy.
Collaborations
Achete has collaborated with several professionals in his field, including Thiago De Lourenço E Vasconcelos and Bruno Santos De Oliveira. These collaborations have contributed to the advancement of his research and the successful development of his patents.
Conclusion
Carlos Alberto Achete is a distinguished inventor whose work in scanning probe microscopy has led to significant advancements in the field. His innovative patents reflect his dedication to improving optical efficiency and resolution in microscopy applications.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile