The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 30, 2019
Filed:
May. 06, 2016
Universidade Federal DE Minas Gerais—ufmg, Belo Horizonte, BR;
Instituto Nacional DE Metrologia, Qualidade E Technologia—inmetro, Rio de Janeiro, BR;
Thiago De Lourenço E Vasconcelos, Belo Horizonte, BR;
Bráulio Soares Archanjo, Belo Horizonte, BR;
Luiz Gustavo De Oliveira Lopes Cançado, Belo Horizonte, BR;
Carlos Alberto Achete, Belo Horizonte, BR;
Wagner Nunes Rodrigues, Belo Horizonte, BR;
Ado Jorio De Vasconcelos, Belo Horizonte, BR;
Benjamin Fragneaud, Belo Horizonte, BR;
Douglas Dos Santos Ribeiro, Belo Horizonte, BR;
Cassiano Rabelo E Silva, Belo Horizonte, BR;
Bruno Santos De Oliveira, Belo Horizonte, BR;
UNIVERSIDADE FEDERAL DE MINAS GERAIS—UFMG, Belo Horizonte, BR;
INSTITUTO NACIONAL DE METROLOGIA QUALIDADE E TECNOLOGIA—INMETRO, Rio de Janeiro, BR;
Abstract
The present invention relates to a metallic device for near-field optical microscopy and spectroscopy, as well as to a method of preparing it. Said device comprises a single body () with longitudinal prolongation (), nanometric apex () and has at least one trimming () on its surface, being applied as a probe of high optical efficiency, with adequate dimensions and details that enable the best photon-plasmon coupling, enabling the analysis, with high space resolution, of structures of nanometric dimensions with high efficiency and reproducibility.
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