Rio de Janeiro, Brazil

Bruno Santos De Oliveira

This inventor holds 2 USPTO granted patents. Top assignees: Instituto Nacional De Metrologia Qualidade E Technologia-Immetro, Instituto Nacional De Metrologia Qualidade E Tecnologia—inmetro, Universidade Federal De Menas Gerais-Ufmg. Active years: 2019-2020.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Bruno Santos De Oliveira. Retrieved from https://idiyas.com/inventor/bruno-santos-de-oliveira

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 10.0

ph-index = 1


Location History:

  • Belo Horizonte, BR (2019)
  • Rio de Janeiro, BR (2020)

Company Filing History:


Years Active: 2019-2020

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2 patents (USPTO):Explore Patents

Title: Innovations of Bruno Santos De Oliveira

Introduction

Bruno Santos De Oliveira is a notable inventor based in Rio de Janeiro, Brazil. He has made significant contributions to the field of microscopy through his innovative patents. With a total of two patents to his name, his work focuses on enhancing the capabilities of scanning probe microscopy and near-field optical microscopy.

Latest Patents

Bruno's latest patents include a "Metallic device for scanning probe microscopy and method for manufacturing same." This invention describes a device designed for use in scanning probe microscopy, featuring a single body with two parts. The second part has a submicrometric point that defines a nanoscale apex. Additionally, he has developed a method for manufacturing a high optical efficiency probe for scanning probe microscopy. His other patent, "Metallic device for scanning near-field optical microscopy and spectroscopy and method for manufacturing same," relates to a metallic device for near-field optical microscopy and spectroscopy. This device comprises a single body with a longitudinal prolongation and a nanometric apex, designed to enable high optical efficiency and detailed analysis of nanometric structures.

Career Highlights

Bruno has worked at prestigious institutions such as the Federal University of Minas Gerais (UFMG) and the National Institute of Metrology, Quality and Technology (Inmetro). His experience in these organizations has contributed to his expertise in the field of metrology and microscopy.

Collaborations

Throughout his career, Bruno has collaborated with notable colleagues, including Thiago De Lourenço E Vasconcelos and Carlos Alberto Achete. These collaborations have likely enriched his research and development efforts.

Conclusion

Bruno Santos De Oliveira is a distinguished inventor whose work in microscopy has led to significant advancements in the field. His innovative patents reflect his commitment to enhancing scientific research and technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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