The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 31, 2020
Filed:
Dec. 13, 2016
Universidade Federal DE Minas Gerais—ufmg, Belo Horizonte, BR;
Instituto Nacional DE Metrologia, Qualidade E Tecnologia—inmetro, Rio de Janeiro, BR;
Thiago De Lourenço E Vasconcelos, Rio de Janeiro, BR;
Bruno Santos De Oliveira, Rio de Janeiro, BR;
Carlos Alberto Achete, Rio de Janeiro, BR;
Braulio Soares Archanjo, Rio de Janeiro, BR;
Ado Jorio De Vasconcelos, Belo Horizonte, BR;
Luiz Gustavo De Oliveira Lopes Cançado, Belo Horizonte, BR;
Wagner Nunes Rodrigues, Belo Horizonte, BR;
Caroline Arantes Da Silva Wetzstein, Rio de Janeiro, BR;
Rogerio Valaski, Rio de Janeiro, BR;
Cassiano Rabelo E Silva, Belo Horizonte, BR;
Abstract
Described is a device for use in scanning probe microscopy and to a method for manufacturing same. The metallic device has a single body with two parts, wherein the second part has a submicrometric point that defines a nanoscale apex. Also provided is a method for manufacturing a high optical efficiency probe for scanning probe microscopy.