This inventor holds 1 USPTO granted patent. Top assignees: Instituto Nacional De Metrologia Qualidade E Technologia-Immetro, Universidade Federal De Menas Gerais-Ufmg. Active years: 2020.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2020
Title: Rogerio Valaski: Innovator in Scanning Probe Microscopy
Introduction
Rogerio Valaski is a notable inventor based in Rio de Janeiro, Brazil. He has made significant contributions to the field of scanning probe microscopy through his innovative designs and methods. His work focuses on enhancing the capabilities of microscopy devices, which are essential for various scientific applications.
Latest Patents
Rogerio Valaski holds a patent for a "Metallic device for scanning probe microscopy and method for manufacturing same." This invention describes a device designed for use in scanning probe microscopy, featuring a single body with two parts. The second part of the device includes a submicrometric point that defines a nanoscale apex. Additionally, the patent outlines a method for manufacturing a high optical efficiency probe for scanning probe microscopy.
Career Highlights
Throughout his career, Rogerio Valaski has worked with esteemed institutions such as the Federal University of Minas Gerais (UFMG) and the National Institute of Metrology, Quality and Technology (Inmetro). His experience in these organizations has allowed him to develop and refine his innovative ideas in microscopy.
Collaborations
Rogerio has collaborated with notable colleagues, including Thiago De Lourenço E Vasconcelos and Bruno Santos De Oliveira. These partnerships have contributed to the advancement of his research and the successful development of his patented technologies.
Conclusion
Rogerio Valaski's contributions to scanning probe microscopy exemplify the impact of innovation in scientific research. His patented device and methods represent a significant advancement in the field, showcasing his dedication to enhancing microscopy technology.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile