Essex, VT, United States of America

Brian P Conchieri

This inventor holds 1 USPTO granted patent. Top assignee: Globalfoundries Inc.. Active years: 2018.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Brian P Conchieri. Retrieved from https://idiyas.com/inventor/brian-p-conchieri-pjj39z39

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 8.0

ph-index = 1


Company Filing History:


Years Active: 2018

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1 patent (USPTO):Explore Patents

Title: Innovations by Brian P. Conchieri in Interface Monitoring

Introduction

Brian P. Conchieri, an accomplished inventor based in Essex, Vermont, has made significant contributions to the field of semiconductor technology. With a focus on innovative testing structures, he holds one patent that highlights his expertise and commitment to advancing technology.

Latest Patents

Brian's notable patent is titled "Test Structure for Monitoring Interface Delamination." This invention introduces a unique test structure that encompasses two or more devices, each featuring a wire within a dielectric material and a first via connected to the wire. Each device also includes a test pad linked to the first via and a polysilicon resistor attached to the wire. Notably, the polysilicon resistors across the devices are electrically tied together, providing a cohesive system for monitoring delamination. In addition to the structural design, Brian's patent outlines a method for forming the interconnect structure, which is aimed at effective testing methodologies in semiconductor applications.

Career Highlights

Brian currently works at GlobalFoundries Inc., where he continues to push the boundaries of semiconductor innovations. His role at GlobalFoundries allows him to collaborate with leading industry professionals and contribute to key projects that enhance microelectronics technology.

Collaborations

Throughout his career, Brian has partnered with talented colleagues such as Edward Crandal Cooney III and Gary L. Milo. These collaborations have likely fostered an environment of creativity and innovation, resulting in advancements that benefit the field of semiconductor research and application.

Conclusion

In summary, Brian P. Conchieri's inventions, particularly his patent for a test structure monitoring interface delamination, demonstrate his innovative spirit and technical expertise. His ongoing work at GlobalFoundries and collaborations with esteemed colleagues position him as a noteworthy figure in the semiconductor industry. As technologies continue to evolve, contributions from inventors like Brian will remain crucial for future advancements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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