Icheon-si, South Korea

Boo Ho Jung

USPTO Granted Patents = 5 

Average Co-Inventor Count = 6.4

ph-index = 1

Forward Citations = 12(Granted Patents)


Location History:

  • Ichon-shi, KR (2013)
  • Icheon-si, KR (2013 - 2015)
  • Icheon-si Gyeonggi-do, KR (2015)

Company Filing History:


Years Active: 2013-2015

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5 patents (USPTO):Explore Patents

Title: Innovations of Boo Ho Jung

Introduction

Boo Ho Jung is a prominent inventor based in Icheon-si, South Korea. He has made significant contributions to the field of semiconductor technology, holding a total of 5 patents. His work focuses on methods to enhance the performance and reliability of semiconductor apparatuses.

Latest Patents

One of his latest patents is titled "Method for reducing output data noise of semiconductor apparatus and semiconductor apparatus implementing the same." This invention provides a semiconductor apparatus that includes multiple output buffers connected to various power sources. It features a data noise measuring unit that fixes the output data of a selected output buffer to a specific level, measures the noise of the output data using capacitance, and controls the slew rate of the output buffers based on the noise. Another related patent outlines a method for reducing output data noise in semiconductor apparatuses, detailing steps to drive low data to a specific output buffer while managing data transitions in other buffers.

Career Highlights

Boo Ho Jung is currently employed at SK Hynix Inc., a leading company in the semiconductor industry. His innovative work has positioned him as a key figure in advancing semiconductor technology.

Collaborations

He collaborates with talented coworkers, including Jun Ho Lee and Sun Ki Cho, who contribute to his projects and innovations.

Conclusion

Boo Ho Jung's contributions to semiconductor technology through his patents and collaborations highlight his role as an influential inventor in the industry. His work continues to pave the way for advancements in semiconductor performance and reliability.

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