The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 01, 2015

Filed:

Dec. 23, 2014
Applicant:

SK Hynix Inc., Icheon-si Gyeonggi-do, KR;

Inventors:

Sung Woo Han, Icheon-si Gyeonggi-do, KR;

Ic Su Oh, Icheon-si Gyeonggi-do, KR;

Jun Ho Lee, Icheon-si Gyeonggi-do, KR;

Boo Ho Jung, Icheon-si Gyeonggi-do, KR;

Sun Ki Cho, Icheon-si Gyeonggi-do, KR;

Yang Hee Kim, Icheon-si Gyeonggi-do, KR;

Tae Hoon Kim, Icheon-si Gyeonggi-do, KR;

Assignee:

SK Hynix Inc., Gyeonggi-do, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04B 3/32 (2006.01); H04M 3/34 (2006.01); G06F 17/50 (2006.01); H03K 3/013 (2006.01); H03K 5/12 (2006.01);
U.S. Cl.
CPC ...
H03K 3/013 (2013.01); H03K 5/12 (2013.01); G06F 17/5022 (2013.01);
Abstract

Provided is a semiconductor apparatus which includes a plurality of output buffers configured to connect a plurality of power sources, and a data noise measuring unit configured to fix an output data of a selected output buffer among the plurality of output buffers to have a specific level, measure a noise of the output data using a capacitance and control a slew rate of the plurality of output buffers based on the noise.


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