The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 27, 2015

Filed:

Dec. 19, 2012
Applicant:

SK Hynix Inc., Icheon-si, KR;

Inventors:

Sung Woo Han, Icheon-si, KR;

Ic Su Oh, Icheon-si, KR;

Jun Ho Lee, Icheon-si, KR;

Boo Ho Jung, Icheon-si, KR;

Sun Ki Cho, Icheon-si, KR;

Yang Hee Kim, Icheon-si, KR;

Tae Hoon Kim, Icheon-si, KR;

Assignee:

SK Hynix Inc., Gyeonggi-do, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04B 3/32 (2006.01); H04M 3/34 (2006.01); G06F 17/50 (2006.01); H03K 5/12 (2006.01);
U.S. Cl.
CPC ...
H03K 5/12 (2013.01);
Abstract

Provided is a method for reducing output data noise of a semiconductor apparatus which includes a plurality of output buffers to output data. The method includes the steps of: driving low data to a specific output buffer among the plurality of output buffers, and driving data transiting from a high level to a low level to the other output buffers; and measuring the magnitude of data noise occurring in output data of the specific output buffer, and deciding slew rates of the plurality of output buffers based on the measurement result.


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