Hong Kong, China

Binjie Xin


Average Co-Inventor Count = 2.7

ph-index = 2

Forward Citations = 27(Granted Patents)


Company Filing History:


Years Active: 2004-2005

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2 patents (USPTO):Explore Patents

Title: Innovations by Binjie Xin in Fabric Analysis

Introduction

Binjie Xin is a notable inventor based in Hong Kong, CN. He has made significant contributions to the field of fabric analysis, holding 2 patents that focus on innovative measurement and evaluation systems for textile structures and garment appearances.

Latest Patents

His latest patents include a "Three Dimensional Measurement, Evaluation and Grading System for Fabric/Textile Structure/Garment Appearance." This method utilizes a fixed digital camera positioned above a piece of fabric, employing at least two different parallel light beams from inclined directions. The camera captures various reflected images of the fabric's surface, which are then analyzed to derive parameters relevant to its appearance. Specifically, values of P+Q are used in grading evaluations, where P and Q represent the summations of surface gradients at multiple points across the fabric.

Another significant patent is the "System for Analysis of Fabric Surface." This system features a feed mechanism that runs fabric over a crest, along with an image capturing device that records profile images of the fabric surface. A computer system processes these images to create a three-dimensional representation of the fabric, identifying its characteristics and comparing them to reference data to determine a grade for the fabric.

Career Highlights

Binjie Xin is affiliated with The Hong Kong Polytechnic University, where he continues to advance research in fabric technology and innovation. His work has garnered attention for its practical applications in the textile industry.

Collaborations

He collaborates with esteemed colleagues such as Jinlian Hu and Yueyang Guo, contributing to a dynamic research environment focused on textile innovations.

Conclusion

Binjie Xin's contributions to fabric analysis through his innovative patents demonstrate his commitment to advancing textile technology. His work not only enhances the understanding of fabric properties but also paves the way for improved quality assessment in the textile industry.

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