Hsinchu, Taiwan

Bih-Huey Lee

This inventor holds 1 USPTO granted patent. Top assignee: Taiwan Semiconductor Manufacturing Comp. Ltd.. Active years: 2004.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Bih-Huey Lee. Retrieved from https://idiyas.com/inventor/bih-huey-lee

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2004

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1 patent (USPTO):Explore Patents

Title: Innovations by Bih-Huey Lee

Introduction

Bih-Huey Lee is a notable inventor based in Hsinchu, Taiwan. He has made significant contributions to the field of semiconductor technology. His work focuses on improving the quality of silicon substrates, which is crucial for the manufacturing of electronic components.

Latest Patents

Bih-Huey Lee holds a patent for "In-line monitoring of silicide quality using non-destructive methods." This innovative method allows for the monitoring of silicon quality during the pre-salicidation phase of the silicon substrate. By observing the optical refractive index of the pre-salicide substrate, this technique provides valuable insights into the quality of the silicon substrate at a critical point in the substrate processing cycle. He has 1 patent to his name.

Career Highlights

Bih-Huey Lee is currently employed at Taiwan Semiconductor Manufacturing Company Limited, a leading firm in the semiconductor industry. His expertise and innovative approaches have contributed to advancements in semiconductor manufacturing processes.

Collaborations

Bih-Huey Lee has worked alongside his coworker, Yun-Hung Shen, to further enhance the research and development efforts within their organization.

Conclusion

Bih-Huey Lee's contributions to semiconductor technology through his innovative patent demonstrate his commitment to advancing the field. His work continues to impact the quality of silicon substrates, which is essential for the electronics industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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