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For the Inventor, By the Inventor

Phoenix, AZ, United States of America

Bert M Vermeire

This inventor holds 11 USPTO granted patents. Top assignees: Environmental Metrology Corporation, Ridgetop Group, Inc.. Active years: 2007-2012.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Bert M Vermeire. Retrieved from https://idiyas.com/inventor/bert-m-vermeire

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 11

Average Co-Inventor Count = 2.4

ph-index = 6

Forward Citations = 151(Granted Patents)


Location History:

  • Tucson, AZ (US) (2007)
  • Phoenix, AZ (US) (2007 - 2009)
  • Mesa, AZ (US) (2007 - 2011)
  • Escondido, CA (US) (2012)

Company Filing History:

goldMedal6 out of 6 
 
Environmental Metrology Corporation
 patents
silverMedal5 out of 9 
 
Ridgetop Group, Inc.
 patents

Years Active: 2007-2012

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11 patents (USPTO):Explore Patents
1. 8253422 - Method of manufacture of wafers using an electro-chemical residue sensor (ECRS) (2012-08-28),
2. 8120368 - Method of monitoring the clean/rinse/dry processes of patterned wafers using an electro-chemical residue sensor (ECRS) (2012-02-21),
3. 8030943 - Circuit for the detection of solder-joint failures in a digital electronic package (2011-10-04),
4. 7932726 - Method of design optimization and monitoring the clean/rinse/dry processes of patterned wafers using an electro-chemical residue sensor (ECRS) (2011-04-26),
5. 7501832 - Method and circuit for the detection of solder-joint failures in a digital electronic package (2009-03-10),
6. 7489141 - Surface micro sensor and method (2009-02-10),
7. 7332902 - Micro sensor for electrochemically monitoring residue in micro channels (2008-02-19),
8. 7317317 - Shielded micro sensor and method for electrochemically monitoring residue in micro features (2008-01-08),
9. 7271608 - Prognostic cell for predicting failure of integrated circuits (2007-09-18),
10. 7239163 - Die-level process monitor and method (2007-07-03),
11. 7196294 - Method and resistive bridge circuit for the detection of solder-joint failures in a digital electronic package (2007-03-27),

Title: Biography of Bert M Vermeire

Introduction: Bert M Vermeire is an accomplished inventor based in Phoenix, AZ (US), known for his significant contributions to the field of micro-device manufacturing. He holds a total of 11 patents, showcasing his innovative approach to improving manufacturing processes.

Latest Patents: Among his latest patents is a method of manufacture of wafers using an electro-chemical residue sensor (ECRS). This method enhances the clean, rinse, and dry processes during the production of integrated circuits (ICs), micro-electromechanical systems (MEMS), and other micro-devices. The ECRS provides in-situ and real-time measurements of residual contamination, allowing for optimized production processes while conserving resources. Another notable patent is the method of monitoring the clean/rinse/dry processes of patterned wafers using the ECRS, which further improves efficiency and process control.

Career Highlights: Bert has worked with several notable companies, including Environmental Metrology Corporation and Ridgetop Group, Inc. His experience in these organizations has contributed to his expertise in the field of electro-chemical sensors and manufacturing processes.

Collaborations: Throughout his career, Bert has collaborated with esteemed colleagues such as Farhang F Shadman and Philipp S Spuhler. These partnerships have fostered innovation and advancements in the technologies he has developed.

Conclusion: Bert M Ver

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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