Bernd Rieger

Title: **Inventor Bernd Rieger: A Pioneer in Advanced Imaging Techniques**

Introduction

Bernd Rieger, based in Delft, Netherlands, is a prominent inventor known for his innovative contributions to the field of particle optics and imaging technology. With a total of four patents to his name, Rieger has made significant strides in enhancing the precision of imaging methods utilized in microscopy, particularly with Scanning Transmission Electron Microscopes (STEM) and Transmission Electron Microscopes (TEM).

Latest Patents

Two of Bernd Rieger's latest patents showcase his expertise and dedication to refining optical methodologies. The first patent, titled **"Method for adjusting a stem equipped with an aberration corrector,"** details a sophisticated procedure for optimizing a corrector in a STEM using crystalline samples. This method involves recording a through-focus series of images, converting them into Fourier space, and analyzing their symmetry to tune the corrector for improved image clarity and reduced distortion.

The second patent, **"Method for determining distortions in a particle-optical apparatus,"** outlines a method for diagnosing and correcting distortions within a TEM’s projection system. By collecting numerous images of a sample with slight displacements, Rieger's technique allows for the identification of differential aberrations, enabling precise correction of displayed images without the need for highly accurate sample alignment or knowledge of the sample's geometric structure.

Career Highlights

Bernd Rieger's career is marked by his association with FEI Company, where he has leveraged his extensive knowledge and skills to further innovations in microscopy. His commitment to advancing imaging technology has led to significant improvements in the capabilities of electron microscopes, supporting researchers across various scientific disciplines.

Collaborations

Throughout his career, Rieger has collaborated with notable colleagues, including Michiel van der Stam and Marinus Johannes van der Zande. These collaborations have fostered a dynamic exchange of ideas and have contributed to the successful development of groundbreaking imaging methods that benefit the scientific community.

Conclusion

With a strong background in particle optics and a proven track record of patents, Bernd Rieger exemplifies the spirit of innovation and research excellence. His contributions to microscopy not only enhance our understanding of materials at the atomic level but also pave the way for future advancements in imaging technologies. As he continues his work at FEI Company, the impact of his inventions will undoubtedly resonate within the field for years to come.