Sunnyvale, CA, United States of America

Ben Shieh


Average Co-Inventor Count = 6.0

ph-index = 1

Forward Citations = 8(Granted Patents)


Company Filing History:


Years Active: 2013

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1 patent (USPTO):

Title: Ben Shieh: Innovator in Integrated Circuit Testing

Introduction

Ben Shieh, an accomplished inventor based in Sunnyvale, California, is recognized for his contributions to the field of integrated circuit (IC) testing. With a background in engineering and technology, he has developed a solution that enhances efficiency in IC yield ramp improvements.

Latest Patents

Ben holds a significant patent for a "Reusable test chip for inline probing of three dimensionally arranged experiments - A Characterization Vehicle (CV) and a method for forming it," which revolutionizes the testing processes in semiconductor manufacturing. This innovation allows for faster learning cycles and diagnosis while simultaneously reducing costs. The design incorporates multiple SF experiments into a single, comprehensive flow mask set, complete with various inline testing points. Its unique arrangement of smaller pads facilitates the testing of interleaved pad frames, supports parallel testing, and utilizes stacked test structures, known as Devices Under Test (DUT's).

Career Highlights

Ben Shieh's career has been marked by a focus on enhancing integrated circuit testing methodologies. His work at Pdf Solutions, Incorporated showcases his dedication to cutting-edge technology and innovation. Through his efforts, he has made substantial advancements that have potential implications for improving IC production efficiency across the industry.

Collaborations

During his professional journey, Ben has collaborated with esteemed colleagues such as Christopher Hess and John Kibarian. Their shared expertise and collective vision contribute to the development of innovative solutions that address complex challenges in the semiconductor sector.

Conclusion

In summary, Ben Shieh stands out as a notable inventor whose work is paving the way for advancements in integrated circuit testing. His patented innovation demonstrates a commitment to efficiency and cost-effectiveness in technology, positioning him as a valuable contributor to the field. Ben's ongoing collaboration with peers further emphasizes his role in driving innovation and excellence in semiconductor manufacturing.

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