This inventor holds 1 USPTO granted patent. Top assignee: Kla Corporation. Active years: 2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2026
Title: Balla Guna Sai Sandeep: Innovator in Deep Learning-Based Defect Detection
Introduction
Balla Guna Sai Sandeep is a notable inventor based in Chennai, India. He has made significant contributions to the field of image processing and defect detection through his innovative patent. His work focuses on utilizing deep learning techniques to enhance the accuracy and efficiency of identifying defects in products.
Latest Patents
Balla Guna Sai Sandeep holds a patent titled "System and method for defect detection using deep learning-based image segmentation." This system is designed to receive training images of features on a sample and generate a segmentation model based on these images. It can analyze product images to identify features of interest and create segmentation masks that correspond to these features. The system also adjusts the size of the segmentation masks based on the identified features and determines whether these features are defects by comparing them against a predetermined threshold. This innovative approach has the potential to revolutionize quality control processes in various industries.
Career Highlights
Balla Guna Sai Sandeep is currently employed at Kla Corporation, where he applies his expertise in deep learning and image processing. His work at Kla Corporation has allowed him to collaborate with talented professionals in the field, further enhancing his skills and contributions to the industry.
Collaborations
Some of his coworkers include Arjun Hegde and Surajit Mondal. Their collaborative efforts contribute to the innovative environment at Kla Corporation, fostering advancements in technology and product quality.
Conclusion
Balla Guna Sai Sandeep is a pioneering inventor whose work in deep learning-based defect detection is making a significant impact in the field. His patent demonstrates the potential of technology to improve quality control processes, showcasing his dedication to innovation and excellence.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
