This inventor holds 1 USPTO granted patent. Top assignee: Jordan Valley Semiconductors Ltd.. Active years: 2013.
Company Filing History:
Years Active: 2013
Title: Ayelet Dag: Innovator in X-ray and VUV Analysis
Introduction
Ayelet Dag is a prominent inventor based in Haifa, Israel. She has made significant contributions to the field of material analysis through her innovative patent. Her work focuses on combining X-ray and VUV (Vacuum Ultraviolet) analysis of thin film layers, which has important applications in various industries.
Latest Patents
Ayelet Dag holds a patent for an apparatus designed for the inspection of samples. This apparatus includes an X-ray source that irradiates a specific location on the sample with a beam of X-rays. An X-ray detector is configured to receive the scattered X-rays from the sample and outputs a first signal indicative of the received X-rays. Additionally, a VUV source irradiates the same location with a beam of VUV radiation, while a VUV detector captures the reflected VUV radiation and outputs a second signal. A processor is then utilized to process both signals to measure a property of the sample. This innovative approach enhances the accuracy and efficiency of material inspections.
Career Highlights
Ayelet Dag is associated with Jordan Valley Semiconductors Ltd., where she applies her expertise in developing advanced inspection technologies. Her work has positioned her as a key figure in the semiconductor industry, contributing to the advancement of material characterization techniques.
Collaborations
Ayelet collaborates with notable colleagues, including Isaac Mazor and Matthew Wormington. Their combined efforts in research and development have furthered the impact of their innovations in the field.
Conclusion
Ayelet Dag's contributions to X-ray and VUV analysis represent a significant advancement in material inspection technology. Her innovative patent and collaboration with industry professionals underscore her role as a leading inventor in her field.