Atsuto Ohta

Title: Innovations by Atsuto Ohta in EL Array Substrate Inspection

Introduction

Atsuto Ohta is a notable inventor based in Kyoto, Japan. He has made significant contributions to the field of electronic display technology, particularly in the inspection methods for EL (Electroluminescent) array substrates. His innovative approach aims to enhance the quality and reliability of EL panels before they are assembled.

Latest Patents

Atsuto Ohta holds a patent for an "Inspection method and apparatus for EL array substrate." This invention provides a method to detect failures on an EL array substrate prior to the assembly of an EL panel. The process involves applying a prescribed potential to a data line to activate a switching transistor for a specific duration. This action charges both a holding capacitor and a parasitic capacitor. After a designated time, the switching transistor is turned on again, and the data line is connected to an integrator. The integrator then detects the amount of charge discharged from the holding and parasitic capacitors, allowing for the identification of any failures on the EL array substrate.

Career Highlights

Atsuto Ohta is currently associated with International Business Machines Corporation (IBM), where he continues to work on advancements in electronic technologies. His expertise in inspection methods has positioned him as a valuable asset in the field of electronic display innovation.

Collaborations

Atsuto collaborates with Tomoyuki Taguchi, a fellow innovator, to further enhance the development of inspection technologies in electronic displays.

Conclusion

Atsuto Ohta's contributions to the inspection methods for EL array substrates represent a significant advancement in electronic display technology. His innovative patent not only improves the quality assurance process but also enhances the reliability of EL panels in the market.