International Business Machines Corporation

Atsuto Ohta

Tomoyuki Taguchi

To provide an inspection method for an EL array substrate that can detect a failure on the EL array substrate before assembling an EL panel. By giving a prescribed potential to a data lineto turn on a switching transistorfor a prescribed time, a holding capacitorand a parasitic capacitorare charged. By turning on again the switching transistorafter a lapse of a prescribed time from turning-off of the switching transistorand by connecting the data lineto an integrator, the holding capacitorand the parasitic capacitorare discharged, and a discharged amount of charge is detected by the integrator. Based on this amount of charge, a failure on an EL array substrate is detected before assembling an EL panel.

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Kyoto, Japan

Atsuto Ohta