The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 16, 2005
Filed:
Mar. 26, 2003
Tomoyuki Taguchi, Kusatsu, JP;
Atsuto Ohta, Kyoto, JP;
Tomoyuki Taguchi, Kusatsu, JP;
Atsuto Ohta, Kyoto, JP;
International Business Machines Corporation, Armonk, NY (US);
Abstract
To provide an inspection method for an EL array substrate that can detect a failure on the EL array substrate before assembling an EL panel. By giving a prescribed potential to a data lineto turn on a switching transistorfor a prescribed time, a holding capacitorand a parasitic capacitorare charged. By turning on again the switching transistorafter a lapse of a prescribed time from turning-off of the switching transistorand by connecting the data lineto an integrator, the holding capacitorand the parasitic capacitorare discharged, and a discharged amount of charge is detected by the integrator. Based on this amount of charge, a failure on an EL array substrate is detected before assembling an EL panel.